new FEI Scios Dualbeam funded through the EPSRC's Capital for great
technologies has been installed and commissioned at the School of
Chemistry's electron microscopy facility.
This new instrument combines a high resolution scanning electron microscope and gallium ion beam for selective milling of the sample. This enables a wide range of imaging options as well as the ability to cross-section and image a sample in-situ and prepare samples for transmission electron microscopy.
For more information please contact David Miller.