Electron Microscopy Facility

JSM-6700F SEM


Dualbeam

Sample Preparation

Jeol JSM-6700F Scanning Electron Microscope

JSM-6700F
Specifications:

Resolution: 3.5nm
Probe Current: 10-12-10-6 A
Accelerating Voltage: 0.5-30 kV
Specimen Size: 125 mm
Detectors: SE, EDX


The JSM-6700F is a high resolution SEM with a field emission gun (FEG) electron source. It is equipped with a secondary electron detector for topographic contrast imaging, a retractable backscattered electron detector for atomic number contrast imaging and an Oxford Inca EDX system for compositional analysis.