Electron Microscopy Facility

JEM-2011 TEM


Dualbeam

Sample Preparation

Jeol JEM-2011 Transmission Electron Microscope

JSM-5600
Specifications:

Resolution: 0.18nm
Probe Current: 10-12-10-6 A
Accelerating Voltage: 200 kV
Specimen Size: 3 mm
Detectors: CCD, Film, EDX
X-Tilt: ±18°.


The JEM-2011 is a conventional TEM with a lanthanum hexaboride electron source. It is used for imaging, electron diffraction and microanalysis of materials. Images can be recorded with a Gatan Multiscan CCD camera fitted below the column or a film camera. The JEM-2011 is equipped with an Oxford ISIS EDX system for compositional analysis.